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Scanning Electron Microscope Facilities

  1. Centers and Labs
  2. Youssef Jameel Science and Technology
  3. Facilities
  4. Characterization Facility
  5. Scanning Electron Microscope Facilities

Scanning Electron Microscope (SEM) facilities provide detailed high-resolution images of the sample by rastering a focussed electron beam across the surface and detecting secondary or backscattered electron signals. An energy-dispersive X-ray analyzer (EDX) is also used to provide elemental identification and quantitative compositional information.

For AUC internal user access requests, click here.

For Reservations: 

External Users

Internal Users

SEM-Main

Model: Leo Supra 55 

Specifications:

  • Ultra-high resolution at low kV: 1 nm @ 15 kV, 1.7 nm @ 1 kV, 4 nm @ 0.1 kV
  • Magnification: 20x to 900,000x
  • Electron gun: thermal field emission type
  • High-efficiency in-lens detector
  • Wide operating voltage range: 0.1 kV to 30 kV
  • Ultra stable high current mode for X-ray analysis and EBSD applications 20 nA/0.2%/h

  

Multi-port analytical specimen chamber 330 mm (Ø) x 270 mm (h).

SEM-4

5" fully motorized eucentric stage.

Neoscope (JCM-6000 Plus) JEOL Benchtop SEM is a compacted SEM that provides the same functions as the Field Emission SEM but with a much smaller scale compared to FE-SEM (maximum of 60000X); it is also equipped with an EDS detector that performs elemental chemical analysis through X-ray detection technique. JEOL Benchtop SEM is quick and handy, but when samples are in nanoscale. FE-SEM is the proper equipment.

Neoscope Benchtop SEM

In Situ, the Tensile Stage applies mechanical tests on samples under SEM, where users can observe and record the real-time deformation and save them as images. The test results are also provided as graphs and output data files. Mechanical tests performed are Tensile, Compression, 3-point bending and 4-point bending tests; they can also be applied outside of the SEM, in which case results are provided as graphs only.

Specifications

  • Sample size Length 36 to 52mm ( depending on the type of tension stage)
  • Parallel part Approx. 2mm x 10mmSpecimen thickness 0.5 to 1.0mm
  • Sample tilt angle 60 ° to 70 °
  • (pretilt 0 ° or 20 °, SEM stage tilt 50 °)
  • Maximum tensile load 1500N to 50N (depending on tension stage type)

tensile STAGE 1500 N

Maximum load 1500N type.